É豸Ãû³Æ Equipment Name
µ¥¾§²ÛÊ½ÖÆÈÞÉ豸 Batch-type Mono-crystalline Texturing Equipment
É豸ÐͺŠEquipment Model
SC-CSZ12000F-16G
É豸ÓÃ; Equipment Application
Ö÷Òª¶Ôµ¥¾§¹èÌ«ÑôÄÜµç³ØÓÃ¹èÆ¬½øÐÐÈÞÃæ¸¯»¯ºÍÇåÏ´´¦Àí¡£
Used for texturing& cleaning of mono crystalline wafers.
¹¤ÒÕÁ÷³Ì Process Flow
È¥ËðÉË¡úÔ¤ÇåÏ´¡úµ¥¾§ÖÆÈÞ¡úºóÇåÏ´»òO3ÇåÏ´¡úËáÏ´¡úÔ¤ÍÑË®¡úºæ¸É£¨¹©²Î¿¼£©
Saw damage removal¡úPre-cleaning¡úMono-texturing¡úPost-cleaning/O3 cleaning¡úAcid cleaning¡úHot water drying¡úDrying (for reference only)
¼¼ÊõÌØµã Features
1¡¢²úÄÜ£º600Ƭ/Åú£¬ 12000Ƭ/Сʱ¡ª¡ª210¹èƬ£¨100Ƭ»¨Àº£©£»720Ƭ/Åú£¬15000Ƭ/Сʱ¡ª¡ª182¹èƬ£¨120Ƭ»¨Àº£©¡£
Throughput:600pcs/batch,12000pcs/h¡ª¡ª210 wafer(100pcs cassette),720pcs/batch,15000pcs/h¡ª¡ª182 wafer(120pcs cassette).
2¡¢¹¤ÒÕ²ÛÑ»·Á¿¿Éµ÷¡£
Process bath circulation volume adjustable.
3¡¢ÖÆÈÞ½ð×ÖËþ¾ùÔÈ£¬¿ÌÊ´Éî¶È¿Éµ÷¡£
Uniform pyramids texture, etch depth adjustable.
4¡¢Ö§³Ö×120¦Ìm¹èƬ¡£
Wafer thickness handling capability up to 120¦Ìm.
5¡¢½à¾»¸ÉÔïÇøÓò£¬×Խྻ¸ÉÔïϵͳ¡£
With clean dry area and self-clean dry system.
6¡¢µÍH2O2ÏûºÄ¡£
Low H2O2 consumption.
7¡¢¿ìËÙ»»Òº£¬ÔÚÏß»»Òº¡£
Quick inline bath change.
8¡¢Ö§³ÖMES¡¢RFID¼°Ñ¡ÅäÔÚÏß³ÆÖع¦Ð§¡£
Available with MES, RFID system, inline weight testing optional.
É豸²ÎÊý Parameters